Lehigh’s scanning electron microscopy (SEM) courses were founded in 1970. More than three decades later, the Lehigh Microscopy School is widely recognized as the largest and best in the world.
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Click on the Lehigh Microscopy School logo to learn more about the upcoming session.
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The next set of courses, set for June 5-16, are designed for individuals who use scanning electron microscopy and x-ray microanalysis in academic, governmental, or industrial laboratories: engineers, technicians, physical and biological scientists, clinicians, forensic scientists and technical managers.
For more information, check out the
Lehigh Microscopy School Web site.